Malvern PANalytical X'Pert PRO MPD

Capabilities provided by the equipment and technical team:

- X-ray diffraction in Bragg-Brentano geometry (θ/2θ);

- Other geometries available (grazing incidence, offset, reciprocal space mapping);

- Low-angle accessory (down to 0.5°), ideal for zeolites and thin films;

- X'Celerator detector providing high signal acquisition (up to 40× higher than a point detector);

- Secondary monochromator, beam knife, spinner and programmable slit, optimizing baseline quality;

- Resolutions down to 0.04° (FWHM);

- Sample characterization with qualitative phase identification (HighScore/COD database);

- Nanoparticle characterization, including crystallite size determination through Rietveld refinement;

- Thin film thickness determination by XRR;

- Rietveld refinement with phase characterization and quantification.